Enhancement of Defect Tolerance in the QCA-based Programmable Logic Array (PLA)
نویسندگان
چکیده
Improved layout of QCA(quantum-dot cellular automata)based PLA (programmable logic array) that enhance the defect tolerance is proposed, in order to develop next generation circuit technology that replace the conventional CMOS technology. We analyze which QCA device (quantum-dot cell) limits the defect tolerance of the AND/OR plane cell of the QCA-PLA by using QCA circuit simulator or QCADesigner. It is assumed that there is single defect in the circuit and the defect model is shift of a QCA device. The result shows that coplanar crossing limits the defect tolerance. Several layouts that possibly improve the defect tolerance are studied. Triple-redundant configuration of the wire shows the best result. We implemented the both AND plane and OR plane with the improved AND/OR plane cell and evaluated the PLA. Here, multiple defects are assumed. Our improved layout shows significant enhancement of the defect tolerance.
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